Dielectric Properties of Au/PVA (Cobalt-Doped)/n-Si Photoconductive Diodes

dc.contributor.authorGökçen, Muharrem
dc.date.accessioned2020-05-01T09:11:25Z
dc.date.available2020-05-01T09:11:25Z
dc.date.issued2013
dc.departmentDÜ, Fen-Edebiyat Fakültesi, Fizik Bölümüen_US
dc.descriptionGokcen, Muharrem/0000-0001-9063-3028;en_US
dc.descriptionWOS: 000312660100014en_US
dc.description.abstractThe voltage (V) and frequency (f) dependence of dielectric parameters such as the dielectric constant (epsilon'), dielectric loss (epsilon aEuro(3)), dielectric loss tangent (tan delta), real and imaginary parts of electrical modulus (M' and MaEuro(3)), and alternating-current (AC) electrical conductivity (sigma (AC)) of Au/PVA (cobalt-doped)/n-Si structures have been investigated by using experimental admittance measurements conducted at room temperature. The values of epsilon', epsilon aEuro(3), and tan delta were found to be strong functions of voltage and frequency, especially at low frequencies in the positive voltage region. It was observed that the values of epsilon' and epsilon aEuro(3) increase as the frequency decreases. The M' values increase with increasing frequency due to increasing dielectric relaxation, while MaEuro(3) values, in general, remain stable as frequency is changed. The sigma (AC) values at each bias voltage increase with increasing frequency.en_US
dc.description.sponsorshipDuzce University Scientific Research ProjectDuzce University [2012.05.02.110]en_US
dc.description.sponsorshipThis work is supported by Duzce University Scientific Research Project (project no. 2012.05.02.110). Also, the author would like to thank Dr. Ibrahim Uslu (Department of Chemistry Education, Gazi University, Turkey), Dr. Tuncay Tunc (Department of Science Education, Aksaray University, Turkey), and Dr. Semsettin Altindal (Department of Physics, Gazi University, Turkey) for providing the material and its spinning.en_US
dc.identifier.doi10.1007/s11664-012-2332-yen_US
dc.identifier.endpage108en_US
dc.identifier.issn0361-5235
dc.identifier.issn1543-186X
dc.identifier.issue1en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.startpage103en_US
dc.identifier.urihttps://doi.org/10.1007/s11664-012-2332-y
dc.identifier.urihttps://hdl.handle.net/20.500.12684/5577
dc.identifier.volume42en_US
dc.identifier.wosWOS:000312660100014en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.relation.ispartofJournal Of Electronic Materialsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectOrganic PVA layeren_US
dc.subjectMPS structuresen_US
dc.subjectdielectric propertiesen_US
dc.subjectelectric modulusen_US
dc.subjectAC electrical conductivityen_US
dc.titleDielectric Properties of Au/PVA (Cobalt-Doped)/n-Si Photoconductive Diodesen_US
dc.typeArticleen_US

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