Characterization of Sm0.3Ce0.2Sr0.5MnO3 as an electron-doped system: structural, electrical, and dielectric properties

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dc.authoridGökçen, Muharrem/0000-0001-9063-3028en_US
dc.authorscopusid57195460994en_US
dc.authorscopusid36786207300en_US
dc.authorscopusid6602912656en_US
dc.authorscopusid57191830278en_US
dc.authorwosidGökçen, Muharrem/A-1235-2016en_US
dc.contributor.authorKoc, N. Soylu
dc.contributor.authorGokcen, M.
dc.contributor.authorVarilci, A.
dc.contributor.authorAltintas, S. P.
dc.date.accessioned2024-08-23T16:07:08Z
dc.date.available2024-08-23T16:07:08Z
dc.date.issued2024en_US
dc.departmentDüzce Üniversitesien_US
dc.description.abstractA novel samarium-based cerium-doped ceramic manganite of Sm0.3Ce0.2Sr0.5MnO3 (SCSMO) was prepared via the high-temperature solid-state reaction method. The experimental investigation focused on exploring the crystallographic, morphological, and dielectric characteristics of the perovskite ceramic. Rietveld's refinements of X-ray diffraction patterns confirm that a single-phase orthorhombic crystal structure with the space group of Pnma (62) without any detectable impurity phase is obtained for ceramic perovskite. Based on X-ray data, the average size of crystallites was determined to be 80.9 nm using the Williamson-Hall method. The surface morphology analysis through scanning electron microscopy (SEM) revealed distinct grains with an average size of 8.22 mu m. The study utilized dielectric and impedance spectroscopy at different temperatures and frequencies to thoroughly examine the electrical parameters of SCSMO. Through this analysis, a relationship between the conduction mechanism and structural qualities was established.en_US
dc.identifier.doi10.1007/s10854-023-11626-w
dc.identifier.issn0957-4522
dc.identifier.issn1573-482X
dc.identifier.issue1en_US
dc.identifier.scopus2-s2.0-85179957888en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.urihttps://doi.org/10.1007/s10854-023-11626-w
dc.identifier.urihttps://hdl.handle.net/20.500.12684/14510
dc.identifier.volume35en_US
dc.identifier.wosWOS:001126567300005en_US
dc.identifier.wosqualityN/Aen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.relation.ispartofJournal of Materials Science-Materials in Electronicsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectImpedance Analysisen_US
dc.subjectLow-Frequencyen_US
dc.subjectManganiteen_US
dc.subjectOxideen_US
dc.subjectNanoparticlesen_US
dc.subjectPerformanceen_US
dc.subjectRelaxationen_US
dc.subjectConductionen_US
dc.subjectBehavioren_US
dc.subjectDopanten_US
dc.titleCharacterization of Sm0.3Ce0.2Sr0.5MnO3 as an electron-doped system: structural, electrical, and dielectric propertiesen_US
dc.typeArticleen_US

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