Structural, optical, and electrical investigation of multilayered MnO2(n)/ NiO(p) heterojunctions for supercapacitors applications

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dc.authoridKaygili, Omer/0000-0002-2321-1455en_US
dc.authoridDemirci, Tuna/0000-0001-8933-4944en_US
dc.authoridAlanazi, Maha/0009-0003-2950-4683en_US
dc.authoridGhrib, Taher/0000-0003-3750-9460en_US
dc.authoridErcan, Filiz/0000-0002-3533-0726en_US
dc.authorscopusid58563323300en_US
dc.authorscopusid16174728400en_US
dc.authorscopusid56235566900en_US
dc.authorscopusid58563323400en_US
dc.authorscopusid37099630300en_US
dc.authorscopusid35254011400en_US
dc.authorscopusid6602167805en_US
dc.authorwosidKaygili, Omer/A-4801-2017en_US
dc.authorwosidDemirci, Tuna/AIC-8826-2022en_US
dc.authorwosidAlenazi, Maha/JVE-1842-2024en_US
dc.contributor.authorAlanazi, Maha
dc.contributor.authorGhrib, Taher
dc.contributor.authorErcan, Filiz
dc.contributor.authorAlsubaie, Mizna
dc.contributor.authorDemirci, Tuna
dc.contributor.authorKaygili, Omer
dc.contributor.authorKayed, Tarek S.
dc.date.accessioned2024-08-23T16:04:32Z
dc.date.available2024-08-23T16:04:32Z
dc.date.issued2023en_US
dc.departmentDüzce Üniversitesien_US
dc.description.abstractHeterojunctions of alternating MnO2 and NiO thin films were deposited on an Indium Tin Oxide (ITO). The MnO2 and NiO thin films were synthesized by electrodeposition and sol-gel methods respectively. The structural morphology of the synthesized heterojunctions was investigated by scanning electron microscopy (SEM) and atomic force microscopy (AFM). The microstructural and chemical compositions were examined by X-ray diffraction (XRD), Fourier transform infrared (FTIR), and Raman techniques. The optical properties were investigated by Ultraviolet-Visible (UV) analysis. The electrical conductivity, specific capacitance, and charge carrier density were determined using the Hall effect and Electrochemical impedance spectroscopy (EIS) methods. As a result, it was found that the MnO2 and NiO thin films crystallize in tetragonal and cubic crystal systems respectively. Increasing the number of NiO/MnO2 heterojunctions increases the electrical conductivity from 9.7 x 10- 7 to 1.2 x 10-3 S.cm- 1, the bandgap decreased 3.16 to 2.62 eV, the volume carrier density rises from 5.17 x 1011 to 4.62 x 1012 cm-3. The specimens constituted of two and four alternative staked MnO2 and NiO layers are characterized by a specific capacitance of 3.6 x 103 and 5.8 x 103 F.g -1 and capacitance retention of 14.8 and 12.9% which consider them promising materials for supercapacitor devices.en_US
dc.identifier.doi10.1016/j.surfin.2023.103321
dc.identifier.issn2468-0230
dc.identifier.scopus2-s2.0-85169809728en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.urihttps://doi.org/10.1016/j.surfin.2023.103321
dc.identifier.urihttps://hdl.handle.net/20.500.12684/14258
dc.identifier.volume42en_US
dc.identifier.wosWOS:001072474600001en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofSurfaces And Interfacesen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectHeterojunctionen_US
dc.subjectMnO2en_US
dc.subjectNiOen_US
dc.subjectSupercapacitoren_US
dc.subjectSpecific capacitanceen_US
dc.subjectThin-Filmsen_US
dc.subjectNanoparticlesen_US
dc.titleStructural, optical, and electrical investigation of multilayered MnO2(n)/ NiO(p) heterojunctions for supercapacitors applicationsen_US
dc.typeArticleen_US

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