Investigation of the variation of dielectric properties by applying frequency and voltage to Al/(CdS-PVA)/p-Si structures

Basit Öğe Kaydı
dc.authoridAzizian-Kalandaragh, Yashar/0000-0001-6181-3767
dc.authorwosidDemir, Gulcin Ersoz/AAQ-1487-2021
dc.contributor.authorAzizian-Kalandaragh, Yashar
dc.contributor.authorYucedag, Ibrahim
dc.contributor.authorDemir, Gulcin Ersoz
dc.contributor.authorAltindal, Semsettin
dc.date.accessioned2021-12-01T18:50:28Z
dc.date.available2021-12-01T18:50:28Z
dc.date.issued2021
dc.department[Belirlenecek]en_US
dc.description.abstractIn this study, the effect of frequency and voltage on the dielectric properties of Al/(CdS-PVA)/p-Si structures prepared using cadmium sulfide (CdS)-polivinyl alcohol (PVA) interface material was investigated. For this purpose, real and imaginary permittivity (epsilon' and epsilon ''), dissipation factor (tan delta), ac electrical conduction mechanism (sigma(ac)), real and imaginary part of electric modulus (M' and M) were obtained by using capacitance-conductance (C-G/omega) measurements at frequency between 5kHz - 5MHz and at voltage between (-1V) - (+1V). All parameters were found to depend considerably on the frequency and voltage. epsilon' and epsilon '' reach higher values at low frequencies due to surface states (N-ss) which can easily monitor ac signal, dipolar polarization and interfacial polarization. Short-range mobility of charge carriers caused the increase of both electrical modulus and sigma(ac) with increasing frequency. Moreover, M '' exhibited a peak behavior which shifts to higher frequency with increasing voltage. Peak behavior could be ascribed to both decrease in polarization and surface states. (C) 2020 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipDuzce University BAP research ProjectsDuzce University [2017.07.02.567, 2013.07.02.204]; Gazi University Scientific Research ProjectGazi University [GU-BAP.05/2019-26]en_US
dc.description.sponsorshipThis work is supported by Duzce University BAP research Projects with 2017.07.02.567 and 2013.07.02.204 numbers and Gazi University Scientific Research Project. (Project Number: GU-BAP.05/2019-26).en_US
dc.identifier.doi10.1016/j.molstruc.2020.129325
dc.identifier.issn0022-2860
dc.identifier.issn1872-8014
dc.identifier.scopus2-s2.0-85091787752en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.urihttps://doi.org/10.1016/j.molstruc.2020.129325
dc.identifier.urihttps://hdl.handle.net/20.500.12684/10882
dc.identifier.volume1224en_US
dc.identifier.wosWOS:000598067700006en_US
dc.identifier.wosqualityQ3en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.relation.ispartofJournal Of Molecular Structureen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectSemiconductor devicesen_US
dc.subjectMPS structuresen_US
dc.subjectDielectric propertiesen_US
dc.subjectFrequency and voltage dependence electric modulusen_US
dc.titleInvestigation of the variation of dielectric properties by applying frequency and voltage to Al/(CdS-PVA)/p-Si structuresen_US
dc.typeArticleen_US

Dosyalar

Orijinal paket
Listeleniyor 1 - 1 / 1
Küçük Resim Yok
İsim:
10882.pdf
Boyut:
6.03 MB
Biçim:
Adobe Portable Document Format
Açıklama:
Tam Metin / Full Text
İndir

Koleksiyon

WoS İndeksli Yayınlar Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu