The effect of temperature on the electrical characteristics of Ti/n-GaAs Schottky diodes
dc.authorid | YILDIRIM, Mert/0000-0002-8526-1802 | |
dc.authorwosid | YILDIRIM, Mert/B-8002-2015 | |
dc.contributor.author | Durmuş, Haziret | |
dc.contributor.author | Tataroğlu, Adem | |
dc.contributor.author | Altındal, Şemsettin | |
dc.contributor.author | Yıldırım, Mert | |
dc.date.accessioned | 2023-07-26T11:54:49Z | |
dc.date.available | 2023-07-26T11:54:49Z | |
dc.date.issued | 2022 | |
dc.department | DÜ, Mühendislik Fakültesi, Mekatronik Mühendisliği Bölümü | en_US |
dc.description.abstract | Schottky diodes still attract researchers as they are used in various device applications. This study provides I-V characteristics of Ti/n-GaAs (80-300 K). Higher barrier height (phi B0) values were obtained for higher tempera-tures, whereas the ideality factor exhibited the opposite behavior. This was associated with a barrier in -homogeneity at the Ti/GaAs interface, which has a Gaussian distribution (GD). The mean barrier height values calculated from the modified Richardson and phi B0 -q/2 kT plots were found to be 0.584 eV and 0.575 eV in the temperature range of 80-160 K. They were found as 1.041 eV and 1.033 eV between 180 K and 300 K, respectively. The modified Richardson constant value, on the other hand, was calculated as 22.06 A cm-2 K-2 (80-160 K) and 13.167 A cm-2 K-2 (180-300 K). These values are higher than the theoretical value for n-GaAs, which is 8.16 A cm-2 K-2. This difference may stem from intense inhomogeneity at the Ti/n-GaAs interface. | en_US |
dc.identifier.doi | 10.1016/j.cap.2022.09.015 | |
dc.identifier.endpage | 89 | en_US |
dc.identifier.issn | 1567-1739 | |
dc.identifier.issn | 1878-1675 | |
dc.identifier.scopus | 2-s2.0-85139290174 | en_US |
dc.identifier.scopusquality | Q2 | en_US |
dc.identifier.startpage | 85 | en_US |
dc.identifier.uri | https://doi.org/10.1016/j.cap.2022.09.015 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12684/12930 | |
dc.identifier.volume | 44 | en_US |
dc.identifier.wos | WOS:000869486600003 | en_US |
dc.identifier.wosquality | Q3 | en_US |
dc.indekslendigikaynak | Web of Science | en_US |
dc.indekslendigikaynak | Scopus | en_US |
dc.institutionauthor | Yıldırım, Mert | |
dc.language.iso | en | en_US |
dc.publisher | Elsevier | en_US |
dc.relation.ispartof | Current Applied Physics | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.snmz | $2023V1Guncelleme$ | en_US |
dc.subject | Schottky Diode; Temperature Effect; Ideality Factor; Barrier Inhomogeneities; Series Resistance; Gaussian Distribution; Semiconductor?S Forbidden Band Gap [4] | en_US |
dc.subject | I-V-T; Conduction Mechanisms | en_US |
dc.title | The effect of temperature on the electrical characteristics of Ti/n-GaAs Schottky diodes | en_US |
dc.type | Article | en_US |
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