Temperature and Interfacial Layer Effects on the Electrical and Dielectric Properties of Al/(CdS-PVA)/p-Si (MPS) Structures

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dc.contributor.authorDemir, Gülçin Ersöz
dc.contributor.authorYücedağ, İbrahim
dc.contributor.authorKalandaragh, Yashar Azizian
dc.contributor.authorAltındal, Şemsettin
dc.date.accessioned2020-04-30T23:32:34Z
dc.date.available2020-04-30T23:32:34Z
dc.date.issued2018
dc.departmentDÜ, Teknoloji Fakültesi, Bilgisayar Mühendisliği Bölümüen_US
dc.descriptionWOS: 000445474800031en_US
dc.description.abstractIn the present study, cadmium sulphide (CdS) nanopowders were prepared by using a simple physical ball milling technique, and their x-ray diffraction (XRD) analysis confirmed the formation of hexagonal wurtzite structure of CdS. The morphology of CdS nanopowders was characterized by scanning electron microscope (SEM). Dielectric and electrical properties of the manufactured Al/(CdS-PVA)/p-Si (MPS) type structures were investigated by capacitance-voltage (C-V) and conductance-voltage (G/-V) measurements as functions of temperature and applied bias voltage at 500kHz. Some main parameters of the structure such as real and imaginary parts of complex dielectric constants, epsilon(=epsilon-j epsilon), loss tangent (tan), a.c. electrical conductivity (sigma(ac)), and real and imaginary parts of complex electric modulus, M*(=M+jM) of the structure were investigated in the temperature range between 230K and 340K. Ln(sigma(ac))-q/kT curve showed a linear behavior. The value of activation energy (E-a) was obtained as 0.0601eV at 5.0V from the slope of this curve. Moreover, argand diagrams of complex modulus were studied to determine relaxation process of these structures.en_US
dc.description.sponsorshipDuzce University Scientific Research ProjectDuzce University [2017.07.02.567]; Gazi University Scientific Research ProjectGazi University [GU-BAP.05/2018-10]en_US
dc.description.sponsorshipThis study was financially supported by Duzce University Scientific Research Project (Project Number: 2017.07.02.567) and Gazi University Scientific Research Project (Project Number: GU-BAP.05/2018-10).en_US
dc.identifier.doi10.1007/s11664-018-6578-xen_US
dc.identifier.endpage6606en_US
dc.identifier.issn0361-5235
dc.identifier.issn1543-186X
dc.identifier.issue11en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.startpage6600en_US
dc.identifier.urihttps://doi.org/10.1007/s11664-018-6578-x
dc.identifier.urihttps://hdl.handle.net/20.500.12684/4757
dc.identifier.volume47en_US
dc.identifier.wosWOS:000445474800031en_US
dc.identifier.wosqualityQ3en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.relation.ispartofJournal Of Electronic Materialsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCdS-PVA compositesen_US
dc.subjectnanostructuresen_US
dc.subjectthermal propertiesen_US
dc.subjectelectrical propertiesen_US
dc.subjectdielectrical propertiesen_US
dc.subjectconductivityen_US
dc.titleTemperature and Interfacial Layer Effects on the Electrical and Dielectric Properties of Al/(CdS-PVA)/p-Si (MPS) Structuresen_US
dc.typeArticleen_US

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