Application of Classical Fenton Process and Advanced Photo Electro Fenton Process for the Degradation of COD from Wood Processing Wastewater: A Comparative Study

dc.contributor.authorSolak, Murat
dc.date.accessioned2024-08-23T16:08:08Z
dc.date.available2024-08-23T16:08:08Z
dc.date.issued2023en_US
dc.departmentDüzce Üniversitesien_US
dc.description.abstractIn this study, Chemical Oxygen Demand (COD) removal efficiency from wood processing wastewaters by Fenton Process (FP) and Photo Electro Fenton Process (PEFP) were examined. Important operating parameters such as pH, Fe+2 concentration/(amper for PEFP), H2O2 concentration and reaction time were optimized. Optimum operation conditions of the FP were pH 3.5, 1.4 gr/L Fe2+ concentration and 50 gr/L H2O2 concentration and 150 min. reaction time while they were pH 3.00, 9.99 mA/cm2 current density and 70 gr/L H2O2 concentration and 150 min reaction time in PEFP. At the optimum conditions, COD removal efficiency of FP and PEFP was 91% and 99%, respectively. Sludge production of FP was 20% higher than PEFP at the optimum conditions.en_US
dc.identifier.doi10.16984/saufenbilder.1173306
dc.identifier.endpage522en_US
dc.identifier.issn1301-4048
dc.identifier.issn2147-835X
dc.identifier.issue3en_US
dc.identifier.startpage512en_US
dc.identifier.trdizinid1184572en_US
dc.identifier.urihttps://doi.org/10.16984/saufenbilder.1173306
dc.identifier.urihttps://search.trdizin.gov.tr/tr/yayin/detay/1184572
dc.identifier.urihttps://hdl.handle.net/20.500.12684/15114
dc.identifier.volume27en_US
dc.indekslendigikaynakTR-Dizinen_US
dc.institutionauthorSolak, Muraten_US
dc.language.isoenen_US
dc.relation.ispartofSakarya Üniversitesi Fen Bilimleri Enstitüsü Dergisien_US
dc.relation.publicationcategoryMakale - Ulusal Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.titleApplication of Classical Fenton Process and Advanced Photo Electro Fenton Process for the Degradation of COD from Wood Processing Wastewater: A Comparative Studyen_US
dc.typeArticleen_US

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