Investigation of the Frequency and Voltage Dependent Dielectric Properties of Au/n-SiC Metal Semiconductor (MS) and Au/Al2O3/n-SiC Metal-InsulatorSemiconductor (MIS) Structures için istatistikler
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| Investigation of the Frequency and Voltage Dependent Dielectric Properties of Au/n-SiC Metal Semiconductor (MS) and Au/Al2O3/n-SiC Metal-InsulatorSemiconductor (MIS) Structures | 2 |
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| Mayıs 2025 | 0 |
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| 13691.pdf | 4 |
