On the profile of temperature and voltage dependence of interface states and resistivity in Au/n-Si structure with 79 angstrom insulator layer thickness için istatistikler
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| On the profile of temperature and voltage dependence of interface states and resistivity in Au/n-Si structure with 79 angstrom insulator layer thickness | 2 |
Aylık toplam ziyaret
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| Mayıs 2026 | 0 |
| Haziran 2026 | 0 |
| Temmuz 2026 | 0 |
| Ağustos 2026 | 0 |
| Eylül 2026 | 0 |
| Ekim 2026 | 0 |
| Kasım 2026 | 0 |
