Yazar "Tatli, Zafer" seçeneğine göre listele

Listeleniyor 1 - 1 / 1
  • Küçük Resim Yok
    Öğe
    The dielectric characteristics of spray deposited α-Si3N4:ZnO thin films: The nitride effect on frequency-dependent capacitance and conductance profiles
    (Elsevier, 2024) Ibrahimoglu, Erhan; Demir, Ahmet; Caliskan, Fatih; Tatli, Zafer
    The study focused on the effect of alpha-Si3N4 doping on the electrical/dielectric properties of ZnO thin films. Both alpha-Si3N4 doped and additive-free ZnO thin films were coated on p-Si substrates via a spray deposition method to achieve this. The electrical (current density (J)-voltage (V)) and dielectric properties (capacitance (C), conductance (G), dielectric loss (tan delta), reel/imaginary part of dielectric permittivity (epsilon ' and epsilon '') and electric modulus (M ' and M '')) were determined for all samples by using dielectric spectroscopy (DS) method. On the other hand, scanning electron microscopy (FESEM) and energy-dispersive spectroscopy (EDS) analysis were performed to evaluate microstructure, X-ray diffraction (XRD) was used to define chemical composition and atomic-force microscopy (AFM) analysis was carried out to characterise the topology of the coating layers. The thickness/surface roughness was obtained as similar to 82.5 nm/10.6 nm for undoped and- 99.5 nm/10.4 nm for nitride-doped samples, respectively. The maximum capacitance value (C) was obtained as 275 pF at -3.0V and 200 Hz, and the optimal conductance (G) value was also found as 45 mu S around 4.0V and 1 MHz in the nitride-doped sample. The average of alpha and tau values was calculated as 5.67 x 10(-5) s, 0.146 and 4.49 x 10(-5) s, 0.081 for nitride-doped and undoped ZnO, respectively. The increase in performance can be attributed to the homogeneous and almost equally-size distribution of the ZnO grain growth which is strongly controlled by alpha-Si3N4.